SCANNING-TUNNELING-MICROSCOPY OF RF OSCILLATING SURFACES

Citation
E. Chilla et al., SCANNING-TUNNELING-MICROSCOPY OF RF OSCILLATING SURFACES, Annalen der Physik, 3(1), 1994, pp. 21-27
Citations number
18
Categorie Soggetti
Physics
Journal title
Volume
3
Issue
1
Year of publication
1994
Pages
21 - 27
Database
ISI
SICI code
Abstract
Amplitude and phase of high frequency surface acoustic wave (SAW) fiel ds are investigated by a novel scanning tunneling microscopy technique . The gap voltage is modulated at a slightly detuned high frequency. D ue to the nonlinearity of the tunneling process a frequency mixing app ears. For scanned areas with dimensions much smaller than the waveleng th of the SAW a remarkable local variation of amplitude and phase of t he tunneling current at the difference frequency is observed. Dependin g on the local morphology different components of the particle displac ement vector are detected. Model calculations of amplitude and phase i mages are presented for a real topography.