H. Nakashima et K. Uozumi, UNILATERAL CURRENT WITH COULOMB STEPS IN 2 SMALL TUNNEL-JUNCTIONS OF TRAPEZOIDAL BARRIERS CONNECTED IN SERIES, International journal of electronics, 85(2), 1998, pp. 145-151
We theoretically study single electron transport through voltage biase
d two small tunnel junctions of trapezoidal barriers connected in seri
es, and show that this structure possesses a characteristic feature of
unilateral current accompanied with Coulomb steps. Due to such a char
acteristic feature, the structure is expected to serve as a single ele
ctron transistor giving a very good performance. Our analysis is based
on the semi-classical tunnelling model, but the tunnel rates through
each junction are determined by directly calculating a golden rule equ
ation.