UNILATERAL CURRENT WITH COULOMB STEPS IN 2 SMALL TUNNEL-JUNCTIONS OF TRAPEZOIDAL BARRIERS CONNECTED IN SERIES

Citation
H. Nakashima et K. Uozumi, UNILATERAL CURRENT WITH COULOMB STEPS IN 2 SMALL TUNNEL-JUNCTIONS OF TRAPEZOIDAL BARRIERS CONNECTED IN SERIES, International journal of electronics, 85(2), 1998, pp. 145-151
Citations number
15
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00207217
Volume
85
Issue
2
Year of publication
1998
Pages
145 - 151
Database
ISI
SICI code
0020-7217(1998)85:2<145:UCWCSI>2.0.ZU;2-0
Abstract
We theoretically study single electron transport through voltage biase d two small tunnel junctions of trapezoidal barriers connected in seri es, and show that this structure possesses a characteristic feature of unilateral current accompanied with Coulomb steps. Due to such a char acteristic feature, the structure is expected to serve as a single ele ctron transistor giving a very good performance. Our analysis is based on the semi-classical tunnelling model, but the tunnel rates through each junction are determined by directly calculating a golden rule equ ation.