A HIGH-Q BANDPASS FULLY DIFFERENTIAL SC FILTER WITH ENHANCED TESTABILITY

This paper presents a low-cost testing approach for switched-capacitor filters. A design for testability (DfT) methodology is discussed, and a system-level architecture is proposed providing capabilities for an off- and on-line test as well as a builtin self-test (BIST), To prove the feasibility of this approach, it has been applied to a sixth-orde r high-Q bandpass switched-capacitor (SC) filter. The benefit is a sig nificant testability enhancement without degrading filter behavior. Ex perimental results from a silicon prototype are also presented.