This paper describes an experimental static memory cell in GaAs MESFET
technology. The memory cell has been implemented using a mix of sever
al techniques already published in order to overcome some of their pri
ncipal drawbacks related to ground shifting, destructive readout, and
leakage current effects, The cell size is 36 x 37 mu m(2) using a 0.6-
mu m technology. An experimental 32 word x 32 bit array has been desig
ned. From simulation results, an address access time of 1 ns has been
obtained. A small 8 word x 4 bit protoype was fabricated. The cell can
be operated at the single supply voltage from I up to 2 V, The evalua
tion is provided according to the functionality and power dissipation.
Measured results show a total current consumption of 14 mu A/cell whe
n operated at 1 V.