A. Climentfont et al., STOPPING CROSS-SECTION MEASUREMENTS OF TI THIN-FILMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 109-113
The stopping cross section for He-4 projectiles of Ti thin films have
been measured with the backscattering method using a multi-compound ma
rker layer deposited between the test film and the substrate. Problems
derived from the nonuniformity of the marker layer as well as corruga
tions of the films under test have been solved with the help of a comp
uter code to synthesize Rutherford Backscattering Spectrometry (RBS) s
pectra. Stopping cross section values are obtained with an estimated u
ncertainty of 4%. (C) 1998 Elsevier Science B.V.