Pfp. Fichtner et al., NUCLEATION AND GROWTH OF PLATELET BUBBLE STRUCTURES IN HE IMPLANTED SILICON, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 460-464
He+ ions were implanted into(1 0 0) Si at energies from 30 to 120 keV
and fluences from 5 x 10(15) to 1 x 10(16) cm(-2) After implantation,
pieces of these samples were subjected to rapid thermal annealing for
600 s at temperatures ranging from 300 degrees C to 700 degrees C, The
samples were analyzed by Transmission Electron Microscopy (TEM) and b
y Rutherford Backscattering and channeling spectrometry (RBS/C). The T
EM observations were related to the RBS/C measurements and the results
discussed in terms of a nucleation model to explain the formation of
overpressurized bubbles in He implanted and annealed silicon. (C) 1998
Published by Elsevier Science B.V.