A FAST BEAM DEFLECTION SYSTEM FOR THE APPLICATION IN A TUNE OF FLIGHTSPECTROMETER

Authors
PIEL N BECKER HW MEIJER J SCHULTE WH ROLFS C
Citation
N. Piel et al., A FAST BEAM DEFLECTION SYSTEM FOR THE APPLICATION IN A TUNE OF FLIGHTSPECTROMETER, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1235-1239
Citations number
8
Categorie Soggetti
Instument & Instrumentation","Nuclear Sciences & Tecnology","Physics, Atomic, Molecular & Chemical","Physics, Nuclear
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
138
Year of publication
1998
Pages
1235 - 1239
Database
ISI
SICI code
0168-583X(1998)138:<1235:AFBDSF>2.0.ZU;2-F
Abstract
A time-of-flight (ToF) setup using a pulsed ion beam was designed in o rder to optimize the depth resolution of medium energy backscattering towards the sub-nm range. Short pulses were produced by deflection of an ion beam across an aperture using a fast high voltage transistor sw itch. Ion pulses in the range of some 100 ps were produced. The result ing time resolution of the setup was 550 ?+/- 125 ps for the scatterin g of 100 keV protons at a gold surface. Ray tracing calculations revea led that the fast deflection leads to a shift of the mean ion energy a nd additionally to an energy spread causing a dispersion of the pulses . (C) 1998 Elsevier Science B.V.