Ey. Buchin et al., ELECTROLUMINESCENCE AND CURRENT-VOLTAGE CHARACTERISTICS OF N-TYPE POROUS SILICON STRUCTURES, Technical physics letters, 23(6), 1997, pp. 445-447
An investigation is made of a set of n-type porous-silicon structures
exhibiting high electroluminescence efficiency and low degradation, an
d results are presented. These results demonstrate that operating volt
ages corresponding to those of standard ceramic-metal-oxide-semiconduc
tor technology can realistically be achieved. (C) 1997 American Instit
ute of Physics. [S1063-7850(97)01306-2].