Iu. Primak et Ab. Sotsky, ON SENSITIVITY OF INTEGRAL OPTIC MEASUREM ENTS OF ADSORBED LAYER PARAMETERS, Doklady Akademii nauk BSSR, 42(2), 1998, pp. 69-74
The analysis of errors arised under reconstruction of thickness and di
electric permittivity of ultrathin adsorbed layers precipitated on the
surface of the waveguiding structure formed at the prism coupler was
performed. Possibilities of minimization of the mean square errors. fo
r protein adsorbed layers were determined.