Epitaxial lead titanate (PbTiO3) thin films on SrTiO3 (100) substrate
were grown in situ by radiofrequency sputtering for optical waveguidin
g applications. The crystalline quality of the PbTiO3 films deposited
at 550 degrees C has been investigated through x-ray diffraction analy
sis. It indicates that thin films are completely c-axis oriented (rock
ing curve FWHM of 0.2 degrees for the 001 reflection). The transmissio
n spectrum method has been used to measure the dispersion of the refra
ctive index. At 632.8 nm, the PbTiO3 film with an (001) orientation ex
hibits a refractive index of 2.61, which represents 98% of the bulk ma
terial. The prism-coupling technique has been also employed to determi
ne the optical attenuation in the planar waveguide. In this study, we
report a low propagation loss of 2.2 +/- 0.2 dB/cm obtained in a PbTiO
3 optical waveguide. (C) 1998 Optical Society of America.