AL K-EDGE EXTENDED FINE-STRUCTURES IN X-RAY-EMISSION SPECTRA OF ALUMINUM METAL AND ALUMINUM-OXIDE MEASURED BY AN ELECTRON-PROBE MICROANALYZER (EPMA)

The radiative Auger satellite peaks of Al K alpha for aluminum metal a nd aluminum oxide were measured over a small area using an electron pr obe microanalyzer (EPMA). The oscillation was found to be similar to t he extended X-ray absorption fine structure (EXAFS) in the EPMA spectr a, oscillation which was recently discovered by Hayashi et al. (1997) in the X-ray fluorescence (XRF) spectra. The measured EXAFS spectra wi th EPMA are in good agreement with those by Hayashi et al., but here t he oscillation structure could be obtained in a few minutes over a sma ll area by using EPMA. (C) 1998 Elsevier Science B.V.