INVESTIGATION OF THE PHOTOLUMINESCENCE AND MODIFICATION OF INGAP GAAS/INGAAS HETEROSTRUCTURES BY NEAR-FIELD SCANNING MICROSCOPY/

Citation
Sv. Gaponov et al., INVESTIGATION OF THE PHOTOLUMINESCENCE AND MODIFICATION OF INGAP GAAS/INGAAS HETEROSTRUCTURES BY NEAR-FIELD SCANNING MICROSCOPY/, Technical physics letters, 23(8), 1997, pp. 624-625
Citations number
9
Journal title
ISSN journal
10637850
Volume
23
Issue
8
Year of publication
1997
Pages
624 - 625
Database
ISI
SICI code
1063-7850(1997)23:8<624:IOTPAM>2.0.ZU;2-E
Abstract
This study deals with the local spectroscopy and modification of semic onducting InGaP/GaAs/ InGaAs quantum-well heterostructures by near-hel d scanning optical microscopy. The spatial distribution of the photolu minescence intensity in these structures is investigated and spatial n onuniformity of the photoluminescence is observed as a result of the n onuniform properties of the InGaP layers. It is shown for the first ti me that local quenching of the photoluminescence may be achieved by op tically induced impurity diffusion near the quantum well, and this may be utilized to develop low-dimension semiconducting devices. (C) 1997 American Institute of Physics. [S1063-7850(97)02108-3].