A method is discussed for the layer-by-layer determination of the ther
mal diffusivity a and thickness d of the subsurface layers of opaque s
olid objects from measurements of the phase difference of signals of t
wo centered ring-shaped p - n photodiode junctions by successively var
ying the coefficient of angular magnification of the optical system of
the device in which a radiation source with Gaussian cross-sectional
beam power density creates a thermal object on the surface of the obje
ct in the form of harmonically varying concentric heat waves. Estimate
s are found for the frequency range and minimum angular magnification
corresponding to the limits of validity of the relations used to calcu
late a and d. (C) 1997 American Institute of Physics.