The results of measurements of the relaxation and current-voltage char
acteristics of Hg1-xCdxTe n(+) - p junctions in a magnetic field are p
resented. It is shown that the lifetime of the nonequilibrium electron
s in the p-type region undergoes an increase in a magnetic field, whic
h can be associated with the heterogeneous distribution of defects fro
m the junction boundary. The current-voltage characteristics in a magn
etic held exhibit suppression of the diffusion component of the curren
t and an increase in the contribution of the generation-recombination
channel, as well as the appearance of shunting channels, which are ass
ociated with the influence of the surface. (C) 1997 American Institute
of Physics. [S1063-7850(97)03310-7].