H. Hibino et al., GROWTH-PROCESS OF TWINNED EPITAXIAL LAYERS ON SI(111)ROOT-3X-ROOT-3-BAND THEIR THERMAL-STABILITY, Applied surface science, 132, 1998, pp. 41-46
Citations number
23
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
We investigated the growth of twinned epitaxial Si layers on a Si(111)
root 3 X root 3 -B surface. In the initial growth stages, untwinned bi
layer-high (BL-high) and twinned 2-BL-high islands are nucleated, and
the ratio of the number of Si atoms included in the twinned 2-BL-high
islands to the number of the total deposited Si atoms increases as the
surface B concentration increases. Preferred nucleation of Si islands
occurs at domain boundaries of the root 3 X root 3 reconstruction. Mo
reover, BL-high islands rather than 2-BL-high islands nucleate there.
Coalescence of 2-BL-high islands causes the domain boundary density on
the first two bilayers to be much larger than that on the substrate.
Therefore, after completion of the first twinned two bilayers, BL-high
islands are formed predominantly. BL-high islands follow the stacking
sequences of the twinned two bilayers. Thus, grown layers are totally
twinned. We also investigated the thermal stability of twinned epitax
ial layers. The temperature at which twinned epitaxial layers are tran
sformed into untwinned layers strongly depends on the thickness. (C) 1
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