DOMAIN-WALL STRUCTURE OF TE SI(001) SURFACE STUDIED BY LEED/

Citation
T. Ohtani et al., DOMAIN-WALL STRUCTURE OF TE SI(001) SURFACE STUDIED BY LEED/, Applied surface science, 132, 1998, pp. 112-117
Citations number
14
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
132
Year of publication
1998
Pages
112 - 117
Database
ISI
SICI code
0169-4332(1998)132:<112:DSOTSS>2.0.ZU;2-9
Abstract
Adsorbed structures of Te on Si(001) surface have been studied by low energy electron diffraction (LEED) and Auger electron spectroscopy (AE S). As elevating the temperature after the deposition of Te onto the S i(001) single-domain 1 X 2 surface by a few monolayers at room tempera ture, 1 X 1, 2 X 1, 1 X 3 and double-domain 1 X 2 LEED patterns were o bserved at about 350 degrees C, 600 degrees C, 680 degrees C and 800 d egrees C, respectively. During the phase transitions from 1 X 1 to 2 X 1 and from 1 X 3 to 1 X 2 clean surface, continuous shifts of diffrac tion spots were observed. This phenomenon is explained by the formatio n of the domain walls. We considered a one-dimensional chain of scatte rers on the surface which had a statistical distribution of domain len gth, and calculated the structure factor with a simple kinematic scatt ering based on the theory proposed by J.E. Houston and R.L. Park. The results of calculated intensity distributions were in good agreement w ith experiment. (C) 1998 Elsevier Science B.V. All rights reserved.