The hydrogen adsorption and desorption processes on the Si(100)(2 x 1)
surface were investigated using in-situ infrared absorption spectrosc
opy in the multiple internal reflection geometry. It is demonstrated t
hat the distribution of hydride species (SiH, SiH2, and SiH3) signific
antly changes during adsorption of atomic hydrogen and desorption of m
olecular hydrogen. At the initial stages of hydrogen adsorption, the m
onohydride Si (Si-H) and dihydride Si (Si-H-2) are populated, with Si-
H being dominant. For higher hydrogen exposures the dihydride and trih
ydride Si are formed. Thermal annealing causes hydrogen to desorb from
the hydride species. For annealing temperature up to approximately 40
0 degrees C, the trihydride Si is etched away, producing a H-terminate
d surface which consists of monohydride (SiH) and dihydride (SiH2) spe
cies. We demonstrate that the conversion from the monohydride to the d
ihydride phase occurs during thermal annealing. (C) 1998 Elsevier Scie
nce B.V. All rights reserved.