SCANNING TUNNELING MICROSCOPY SPECTROSCOPY OF DANGLING-BOND WIRES FABRICATED ON THE SI(100)-2X1-H SURFACE/

Citation
T. Hitosugi et al., SCANNING TUNNELING MICROSCOPY SPECTROSCOPY OF DANGLING-BOND WIRES FABRICATED ON THE SI(100)-2X1-H SURFACE/, Applied surface science, 132, 1998, pp. 340-345
Citations number
18
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
132
Year of publication
1998
Pages
340 - 345
Database
ISI
SICI code
0169-4332(1998)132:<340:STMSOD>2.0.ZU;2-#
Abstract
We present a scanning tunneling microscopy/spectroscopy (STM/STS) stud y of atomic-scale dangling-bond (DB) wires on a hydrogen-terminated Si (100)-2 x 1-H surface. In the case of DB wires made of paired DBs, the STS shows semiconductive electronic states with a band gap of approxi mately 0.5 eV. The DB wires made of both single and paired DBs show a finite density of states at Fermi energy and do not show semiconductiv e band gaps. We have succeeded in making an atomic-scale wire that has a finite density of states at Fermi energy on a semiconductive surfac e. The results are in good agreement with a recent first-principles th eoretical calculations. (C) 1998 Elsevier Science B.V. All rights rese rved.