T. Hitosugi et al., SCANNING TUNNELING MICROSCOPY SPECTROSCOPY OF DANGLING-BOND WIRES FABRICATED ON THE SI(100)-2X1-H SURFACE/, Applied surface science, 132, 1998, pp. 340-345
Citations number
18
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
We present a scanning tunneling microscopy/spectroscopy (STM/STS) stud
y of atomic-scale dangling-bond (DB) wires on a hydrogen-terminated Si
(100)-2 x 1-H surface. In the case of DB wires made of paired DBs, the
STS shows semiconductive electronic states with a band gap of approxi
mately 0.5 eV. The DB wires made of both single and paired DBs show a
finite density of states at Fermi energy and do not show semiconductiv
e band gaps. We have succeeded in making an atomic-scale wire that has
a finite density of states at Fermi energy on a semiconductive surfac
e. The results are in good agreement with a recent first-principles th
eoretical calculations. (C) 1998 Elsevier Science B.V. All rights rese
rved.