BIAS VOLTAGE-DEPENDENT SCANNING-TUNNELING-MICROSCOPY IMAGES OF A GAAS(110) SURFACE WITH SMALL AG CLUSTERS

Citation
Cs. Jiang et al., BIAS VOLTAGE-DEPENDENT SCANNING-TUNNELING-MICROSCOPY IMAGES OF A GAAS(110) SURFACE WITH SMALL AG CLUSTERS, Applied surface science, 132, 1998, pp. 425-430
Citations number
14
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
132
Year of publication
1998
Pages
425 - 430
Database
ISI
SICI code
0169-4332(1998)132:<425:BVSIOA>2.0.ZU;2-6
Abstract
We report bias voltage-dependent images of scanning tunneling microsco py taken on a GaAs(110) surface with small Ag clusters. The direction of the observed atom rows changes at certain negative and positive sam ple bias voltages (V-s). Such changes are attributed to the different atoms (Ga or As) in the case of V-s < 0 and to the different surface s tates of Ga in the case of V-s > 0. The images also show a change in c ontrast with the V-s. All of these results are explained by tip-induce d and surface charge-induced band bendings in addition to the fundamen tal surface states. (C) 1998 Elsevier Science B.V. All rights reserved .