RAMAN-STUDY OF PHOTOSTRUCTURAL CHANGES IN AMORPHOUS GEXSB0.4S0.6

Citation
Ip. Kotsalas et al., RAMAN-STUDY OF PHOTOSTRUCTURAL CHANGES IN AMORPHOUS GEXSB0.4S0.6, Journal of non-crystalline solids, 226(1-2), 1998, pp. 85-91
Citations number
18
Categorie Soggetti
Material Science, Ceramics
ISSN journal
00223093
Volume
226
Issue
1-2
Year of publication
1998
Pages
85 - 91
Database
ISI
SICI code
0022-3093(1998)226:1-2<85:ROPCIA>2.0.ZU;2-F
Abstract
Raman spectra of amorphous GexSb0.4-xS0.6 films and bulk samples have been measured for several values of x. The observed Raman bands are du e to heteropolar M-S (M = Ge, Sb) bonds in the GeS4 tetrahedra and SbS 3 pyramids, as well as homopolar (defective) M-M bonds whose populatio n increases with increasing x.. Illumination of Ge-rich ternary films by band gap light induces photostructural changes, the most prominent of which being an increase of the relative population of M-M to M-S bo nds. At larger intensities of illumination (by laser light), partial c rystallization of Sb occurs in both films and bulk glasses and, again, this photostructural effect is larger in Ge-rich ternary samples. It is revealed that the SbS3 pyramidal population decreases after either of the above treatments, thus underlining the key role of the Sb-S bon ds in the photostructural changes. Furthermore, the extent of these ef fects is discussed in terms of the defective bond population, the foe volume and dimensionality of the glassy network. (C) 1998 Elsevier Sci ence B.V. All rights reserved.