S. Kitching et Am. Donald, BEAM DAMAGE OF POLYPROPYLENE IN THE ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE - AN FTIR STUDY, Journal of Microscopy, 190, 1998, pp. 357-365
The environmental scanning electron microscope allows the examination
of virtually any specimen in a gaseous environment without the need fo
r coating or drying, Experimental evidence, however, suggests that sig
nificant electron beam damage occurs in hydrated specimens. It is thou
ght that water molecules, ionized by the electron beam, produce hydrog
en and hydroxyl free radicals which attack the organic material of the
sample. In order to elucidate the beam damage mechanisms, areas of po
lypropylene films were exposed to the electron beam at varying doses a
nd exposure times under both hydrating and dehydrating conditions. The
chemical changes occurring as a result of electron-beam irradiation w
ere determined using Fourier transform infra-red microscopy. Direct in
teraction of the electron beam with the polymer results in extensive c
ross-linking, In the presence of water, free-radical-initiated reactio
ns lead to hydrolysis and oxidation of the polymer.