FLUX-CREEP AND MAGNETIC-FIELD DIRECTION DEPENDENCE OF CRITICAL-CURRENT DENSITY IN BI2SR1.7LA0.3CUO6-ABLATION(Y FILMS PREPARED BY LASER)

Using Bi2Sr1.7La0.3CuO6+y thin films, prepared by the laser ablation t echnique, the resistivity was measured as a function of the temperatur e in the mixed state and the critical current density in different mag netic field directions. The temperature dependence of the resistivity was analyzed using an activation type formula. The magnetic field dire ction dependence of the critical current density was discussed on the basis of the two-dimensional property of magnetic flux lines.