Jd. Mackenzie et al., GROWTH OF III-NITRIDES ON ZNO, LIGAO2, AND LIALO2 SUBSTRATES, Journal of the Electrochemical Society, 145(7), 1998, pp. 2581-2585
Citations number
10
Categorie Soggetti
Electrochemistry,"Materials Science, Coatings & Films
The use of oxide substrates for growth of III-nitride materials has be
en investigated. ZnO did not produce any improvement in InAln or AlN m
aterial quality over that obtained using optimized growth conditions o
n sapphire or GaAs. This is believed to be due to the poor thermal sta
bility of ZnO and to the absence of the formation of a nitride layer a
t the substrate surface which acts as both a protective layer and as a
n aid to nucleation. The poor thermal stability of the ZnO prevented t
he use of a pre-growth plasma anneal. Such an anneal was found to prod
uce significant improvement in the surface morphology and structural q
uality of AlN grown on sapphire. Though (100) LiGaO2 and (100) LiAlO2
exhibited greater thermal stability, preliminary experiments on growth
of GaN on LiGaO2 and InN on LiAlO2 suggest that, as for sapphire, low
temperature buffers may be required to improve nucleation behavior.