An attempt is made to apply a method of the C KVV Auger peak width, su
ccessfully used for estimation of sp(2) sites of carbon atoms in a-C a
nd a-C:H films, to amorphous hydrogen-free carbon nitride layers expos
ed to air. The C KVV line width is related to the surface composition
determined by photoelectron spectroscopy. Results show that the width
is strongly influenced by oxygen. An evident correlation between the w
idth and oxygen atomic concentration at layer surfaces is found. (C) 1
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