P. Bracconi et L. Nyborg, QUANTITATIVE PHASE-ANALYSIS AND THICKNESS MEASUREMENT OF SURFACE-OXIDE LAYERS IN METAL AND ALLOY POWDERS BY THE CHEMICAL-GRANULAR METHOD, Applied surface science, 133(1-2), 1998, pp. 129-147
Citations number
44
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
The principles of the chemical-granular analysis of metal and alloy po
wders are reviewed and the results are compared with those provided by
the spectroscopic analytical techniques XPS, AES and SIMS, including
ion etching in their depth-profiling mode, when they are applied to th
e same materials. Several examples are analysed and it is shown that t
he chemical-granular method alone can provide the very same informatio
n as depth profiling. However, it is averaged over a macroscopic powde
r sample in contrast to one or a few single particles. Nevertheless, i
t is the combination of the chemical-granular and depth-profiling anal
yses that really provides an unparalleled description in quantitative
terms of the phase composition and microstructure of either multiphase
and/or irregular surface layers resulting from oxidation, precipitati
on or contamination. (C) 1998 Elsevier Science B.V. All rights reserve
d.