MINIATURE ELECTRIC NEAR-FIELD PROBES FOR MEASURING 3-D FIELDS IN PLANAR MICROWAVE CIRCUITS

Authors
Citation
Yj. Gao et I. Wolff, MINIATURE ELECTRIC NEAR-FIELD PROBES FOR MEASURING 3-D FIELDS IN PLANAR MICROWAVE CIRCUITS, IEEE transactions on microwave theory and techniques, 46(7), 1998, pp. 907-913
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00189480
Volume
46
Issue
7
Year of publication
1998
Pages
907 - 913
Database
ISI
SICI code
0018-9480(1998)46:7<907:MENPFM>2.0.ZU;2-A
Abstract
Three-dimensional (3-D) electric near-field probes applicable to the 0 .05-20-GHz band have been developed, which can measure both the magnit ude and the phase of the microwave field inside of radio-frequency (RF ) and microwave circuits, The field probes have very small dimensions and do not need to be connected to the operating device-under-test (DU T), therefore, the circuit properties are nearly not disturbed by the probe. Investigations on different circuits (e.g., antenna, meander li nes, filters, and power amplifiers) show that such near-field probes c an be applied not only to simple passive circuits, but also to measure the fields inside complex active circuits. These simple, stable, and cheap field probes are very useful for assisting the design of microwa ve circuits, antenna diagnostics, and testing products in industry.