Yj. Gao et I. Wolff, MINIATURE ELECTRIC NEAR-FIELD PROBES FOR MEASURING 3-D FIELDS IN PLANAR MICROWAVE CIRCUITS, IEEE transactions on microwave theory and techniques, 46(7), 1998, pp. 907-913
Three-dimensional (3-D) electric near-field probes applicable to the 0
.05-20-GHz band have been developed, which can measure both the magnit
ude and the phase of the microwave field inside of radio-frequency (RF
) and microwave circuits, The field probes have very small dimensions
and do not need to be connected to the operating device-under-test (DU
T), therefore, the circuit properties are nearly not disturbed by the
probe. Investigations on different circuits (e.g., antenna, meander li
nes, filters, and power amplifiers) show that such near-field probes c
an be applied not only to simple passive circuits, but also to measure
the fields inside complex active circuits. These simple, stable, and
cheap field probes are very useful for assisting the design of microwa
ve circuits, antenna diagnostics, and testing products in industry.