S. Immovilli et al., INTERACTIONS BETWEEN BISMUTH OXIDE AND CERAMIC SUBSTRATES FOR THICK-FILM TECHNOLOGY, Journal of materials research, 13(7), 1998, pp. 1865-1874
We investigated the interactions between screen printed and fired laye
rs of Bi2O3 and ceramic substrates of alumina and beryllia. It was fou
nd that the reaction products are invariably crystalline in nature. Se
veral transitions of Bi2O3 in its polymorphic phases were found to occ
ur on BeO substrates, while newly formed compounds have been observed
to grow on alumina substrates, i.e., Al4Bi2O9 on 99.9% Al2O3 and Bi12S
iO20 On 96% Al2O3 Bismuth deeply penetrates in the ceramic interstices
in all the cases. Until Bi2O3 is not completely reacted, this penetra
tion is diffusion limited (penetration depth w approximate to t(d)(1/2
), where t(d) is the reaction time) with values of the activation ener
gy ranging from 3.7 +/- 0.6 eV (BeO substrate) to 1.4 +/- 0.06 eV (96%
Al2O3 substrate). It is shown that these processes are notably differ
ent to those occurring in PbO/ceramic systems; moreover, they imply di
fferent adhesion phenomena of thick films on different substrates.