ON THE STRESS-FIELD NEAR THE MICRO-CRACK TIP

In this paper a molecular dynamic (MD) simulation is conducted to anal yze the stress field near a micro-crack tip. The model material for si mulation is a single crystal of aluminum. A bulk of 5460 atoms is used to simulate a micro-crack. The interatomic potential of aluminum is c alculated by the pseudopotential method of the Krasko-Gurskii model wh ich takes into account the exchange-correlation effects in the dielect ric function. From the MD results, a model to describe the stress fiel d of the micro-crack is proposed.