HIGH-ENERGY ION-IMPLANTATION INDUCED ELECTRICAL EFFECTS IN BULK AMORPHOUS AS2SE3

Citation
M. Singh et al., HIGH-ENERGY ION-IMPLANTATION INDUCED ELECTRICAL EFFECTS IN BULK AMORPHOUS AS2SE3, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 140(3-4), 1998, pp. 349-360
Citations number
23
Categorie Soggetti
Instument & Instrumentation","Nuclear Sciences & Tecnology","Physics, Atomic, Molecular & Chemical","Physics, Nuclear
ISSN journal
0168583X
Volume
140
Issue
3-4
Year of publication
1998
Pages
349 - 360
Database
ISI
SICI code
0168-583X(1998)140:3-4<349:HIIEEI>2.0.ZU;2-T
Abstract
Bulk amorphous chalcogenide semiconductor: As2Se3, has been irradiated at room temperature with 75 MeV energy Ni, Ge and Ag ions at fluences in the range 1 x 10(13)-1 x 10(14) ions/cm(2). The ion-induced effect s on the electronic properties have been monitored by measuring the de conductivity and frequency dependent ac conductivity (500 Hz - 10 kHz ) as a function of temperature (180-450 K). It is found that the elect rical effects in the samples bombarded with Ni ions are quite differen t from the ones bombarded with Ge/Ag ions. Ion-irradiation induced def ect states near the Fermi level play a dominant role in the variable r ange hopping conduction. Bipolaron hopping conduction appears to be af fected less by ion-irradiation. It is interesting to see that as small an ion-dose as 5 x 10(13) ions/cm(2) is quite effective to modify the electrical transport behaviour of the glass. (C) 1998 Elsevier Scienc e B.V.