M. Singh et al., HIGH-ENERGY ION-IMPLANTATION INDUCED ELECTRICAL EFFECTS IN BULK AMORPHOUS AS2SE3, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 140(3-4), 1998, pp. 349-360
Bulk amorphous chalcogenide semiconductor: As2Se3, has been irradiated
at room temperature with 75 MeV energy Ni, Ge and Ag ions at fluences
in the range 1 x 10(13)-1 x 10(14) ions/cm(2). The ion-induced effect
s on the electronic properties have been monitored by measuring the de
conductivity and frequency dependent ac conductivity (500 Hz - 10 kHz
) as a function of temperature (180-450 K). It is found that the elect
rical effects in the samples bombarded with Ni ions are quite differen
t from the ones bombarded with Ge/Ag ions. Ion-irradiation induced def
ect states near the Fermi level play a dominant role in the variable r
ange hopping conduction. Bipolaron hopping conduction appears to be af
fected less by ion-irradiation. It is interesting to see that as small
an ion-dose as 5 x 10(13) ions/cm(2) is quite effective to modify the
electrical transport behaviour of the glass. (C) 1998 Elsevier Scienc
e B.V.