DEEP WET ETCHING OF BOROSILICATE GLASS USING AN ANODICALLY BONDED SILICON SUBSTRATE AS MASK

Citation
T. Corman et al., DEEP WET ETCHING OF BOROSILICATE GLASS USING AN ANODICALLY BONDED SILICON SUBSTRATE AS MASK, Journal of micromechanics and microengineering, 8(2), 1998, pp. 84-87
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic","Engineering, Mechanical","Instument & Instrumentation
ISSN journal
09601317
Volume
8
Issue
2
Year of publication
1998
Pages
84 - 87
Database
ISI
SICI code
0960-1317(1998)8:2<84:DWEOBG>2.0.ZU;2-9
Abstract
Deep wet etching of borosilicate glass using an anodically bonded sili con substrate as mask is presented. Depths of 500 mu m or more can be achieved very easily. The structured glass wafer can be bonded anodica lly on the same side to another silicon wafer, alter having removed th e bonded silicon mask. A lateral underetching 1.5 times larger than th e depth was measured. An application using this masking technique is a lso presented. It consists of using the anodically bonded frame of a r esonant silicon structure as a mask for deep glass etching to increase the gap between the glass wall and the resonator, thus yielding a hig h Q-factor.