IN-SITU OBSERVATION OF MICROSTRUCTURAL CHANGES OF EMBEDDED SILVER PARTICLES

Citation
A. Heilmann et J. Werner, IN-SITU OBSERVATION OF MICROSTRUCTURAL CHANGES OF EMBEDDED SILVER PARTICLES, Thin solid films, 317(1-2), 1998, pp. 21-26
Citations number
29
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
317
Issue
1-2
Year of publication
1998
Pages
21 - 26
Database
ISI
SICI code
0040-6090(1998)317:1-2<21:IOOMCO>2.0.ZU;2-B
Abstract
Thin plasma polymer films with embedded silver particles were deposite d by simultaneous plasma polymerization and metal evaporation as multi layer systems. The multilayer consists of a first plasma polymer layer , a plasma polymer metal composite layer and a second plasma polymer l ayer, and the silver particles are embedded completely. During anneali ng in situ in the electron microscope, large, nearly spherical silver particles were formed. These recrystallization is a result of atomic d iffusion along the particle surface and along the grain boundaries. At a multilayer system with well-separated silver particles, very small particles (d less than or equal to 10 nm) disappear during annealing, but no significant changes of the size and shape of larger (20 less th an or equal to d less than or equal to 60 nm) particles were found. Th is was interpreted as a result of atomic diffusion of silver through t he polymer matrix (Ostwald ripening). (C) 1998 Elsevier Science S.A.