Combined use of low angle high resolution X-ray diffraction, to ascert
ain film structure, X-ray reflectivity, to obtain film thickness, and
surface Brillouin scattering, to determine film acoustic properties, h
as provided structural and mechanical characterization of thin alloyed
gold films, deposited by magnetron sputtering on Si(001) wafers. Alth
ough weak, the variation of the elastic constants of Au, as induced by
small Cu and Ni contents of the film, has been revealed. The X-ray me
asurement of both film thickness and density is shown to be crucial. (
C) 1998 Elsevier Science S.A.