Metal/insulator multilayers composed of Ti1-xAgx alloy (0 less than or
equal to x less than or equal to 1) and MgO were prepared on MgO(001)
substrates at 273 K by electron beam evaporation in ultrahigh vacuum.
Reflection high-energy electron diffraction, X-ray diffraction and tr
ansmission electron microscopic measurements revealed that Ti0.97Ag0.0
3/MgO and Ti/MgO multilayers were epitaxially grown superlattices. It
was found that the crystal structures of the metals (Ti0.97Ag0.03, Ti)
in the superlattices were tetragonal. (C) 1998 Elsevier Science S.A.