A-C(H) AND A-CNX(H) FILMS DEPOSITED BY MAGNETRON SPUTTERING AND PACVD

Citation
L. Nobili et al., A-C(H) AND A-CNX(H) FILMS DEPOSITED BY MAGNETRON SPUTTERING AND PACVD, Thin solid films, 317(1-2), 1998, pp. 359-362
Citations number
10
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
317
Issue
1-2
Year of publication
1998
Pages
359 - 362
Database
ISI
SICI code
0040-6090(1998)317:1-2<359:AAAFDB>2.0.ZU;2-Y
Abstract
Hydrogenated amorphous carbon films (a-C:H) and hydrogenated carbon fi lms containing as much as 15 at.% nitrogen (a-CNx:H) were synthesised by a plasma-assisted chemical vapour deposition (PACVD) apparatus. By changing the gaseous precursor (CH4, C6H12, C6H6, C2H2) the hydrogen c ontent of the films can be varied between 26 and 58 at.%; serious adhe sion problems were found when the hydrogen percentage attains the high est value. Hydrogen-free layers were deposited by magnetron sputtering in Ar (a-C) and N-2 (a-CNx): nitrogen fractions range from 8 to 28 at .% and increase when the substrate is closer to the graphite target du ring deposition. Film hardness was evaluated by nanoindentation in old er to avoid inflation of the assessed value consequent to the elastic recovery, which results to be quite large in the examined layers. The hardness measurements show values up to similar to 30 GPa and point ou t that both nitrogenation of a-C:H films and deposition by magnetron o f hydrogen-free a-C layers lead to softer materials (similar to 18 GPa ). Main features of Raman spectra are broad 'G' and 'D' peaks, charact eristic of DLC layers: correlation between parameters of these peaks i s discussed. (C) 1998 Elsevier Science S.A.