NORMAL INCIDENCE X-RAY STANDING WAVE-FIELD (NIXSW) STUDY OF THE RH(111)-(ROOT-7X-ROOT-7)R19.1-DEGREES-P SURFACE

Authors
SHARD AG DHANAK VR
Citation
Ag. Shard et Vr. Dhanak, NORMAL INCIDENCE X-RAY STANDING WAVE-FIELD (NIXSW) STUDY OF THE RH(111)-(ROOT-7X-ROOT-7)R19.1-DEGREES-P SURFACE, Surface science, 407(1-3), 1998, pp. 623-628
Citations number
13
Categorie Soggetti
Chemistry Physical
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
407
Issue
1-3
Year of publication
1998
Pages
623 - 628
Database
ISI
SICI code
0039-6028(1998)407:1-3<623:NIXSW(>2.0.ZU;2-G
Abstract
A positional analysis of P in the Rh(111)-(root 7 x root 7)R19.1 degre es-P surface has been carried out with the NIXSW technique using the ( 111) and (11 (1) under bar) reflections. The results favour a model ba sed on a mixed overlayer with the P atoms coplanar with respect to the (111) reflection. This is in accord with a tensor LEED analysis [W. L iu, K.C. Wang, R.A.R. Mitchell, Surf. Sci. 372 (1997) 312.] of the sam e surface. (C) 1998 Elsevier Science B.V. All rights reserved.