A novel molecular ion source based on spontaneous desorption (SD) proc
esses has been developed. The molecular ions from the SD source are us
ed as incident particles for the production of secondary cluster and m
olecular ions. The SD source presents attractive features for surface
analysis and cluster ion beam production. It is shown that analytical
applications can be performed with this source with better efficiency,
in term of analysis time, than with fission fragment impacts used in
plasma desorption mass spectrometry. Low intensity beams of clusters i
ons could be produced with goad stability for a period of several week
s. (C) 1998 John Wiley & Sons, Ltd.