STOCHASTIC MODELING OF THE INFLUENCE OF AN APPLIED ELECTRIC-FIELD ON THE ION RECOMBINATION KINETICS OF MULTIPLE-ION-PAIR SPURS IN LOW-PERMITTIVITY LIQUIDS

Random-flights Monte Carlo simulation and stochastic master equation t echniques are presented for modelling the influence of an applied elec tric field on the ion recombination kinetics in multiple-ion-pair spur s in low-dielectric-permittivity solvents. The calculated free-ion yie ld in two-, three- and four-ion-pair spurs with realistic initial spat ial distributions increases linearly with the applied field strength f or weak fields. The slope-to-intercept ratio predicted for the variati on is numerically similar to that obtained analytically for a single i on pair as the escaping fraction of ion pairs is small and as the Fano factor is close to unity for low-dielectric-permittivity solvents. Co nsequently, for weak electric fields, it is predicted that experimenta l slope-to-intercept ratios for hydrocarbons will not provide any sign ificant information about the spur-size distribution.