STOCHASTIC MODELING OF THE INFLUENCE OF AN APPLIED ELECTRIC-FIELD ON THE ION RECOMBINATION KINETICS OF MULTIPLE-ION-PAIR SPURS IN LOW-PERMITTIVITY LIQUIDS
Sm. Pimblott, STOCHASTIC MODELING OF THE INFLUENCE OF AN APPLIED ELECTRIC-FIELD ON THE ION RECOMBINATION KINETICS OF MULTIPLE-ION-PAIR SPURS IN LOW-PERMITTIVITY LIQUIDS, Journal of the Chemical Society. Faraday transactions, 89(19), 1993, pp. 3533-3539
Citations number
34
Categorie Soggetti
Chemistry Physical","Physics, Atomic, Molecular & Chemical
Random-flights Monte Carlo simulation and stochastic master equation t
echniques are presented for modelling the influence of an applied elec
tric field on the ion recombination kinetics in multiple-ion-pair spur
s in low-dielectric-permittivity solvents. The calculated free-ion yie
ld in two-, three- and four-ion-pair spurs with realistic initial spat
ial distributions increases linearly with the applied field strength f
or weak fields. The slope-to-intercept ratio predicted for the variati
on is numerically similar to that obtained analytically for a single i
on pair as the escaping fraction of ion pairs is small and as the Fano
factor is close to unity for low-dielectric-permittivity solvents. Co
nsequently, for weak electric fields, it is predicted that experimenta
l slope-to-intercept ratios for hydrocarbons will not provide any sign
ificant information about the spur-size distribution.