T. Hecht et al., AUGER TRANSITION RATES FOR THE NEUTRALIZATION OF HE+ IONS IN FRONT OFAN ALUMINUM SURFACE, Surface science, 406(1-3), 1998, pp. 607-613
In a detailed analysis of image charge effects on the trajectories of
He+ ions with keV energies scattered from a clean Al(111) surface unde
r a grazing angle of incidence we find evidence for contributions from
two different Auger processes. From our data we derive Auger neutrali
zation rates for the filling of the Is hole and the Auger deexcitation
rate for the 2s S-3 level as function of the distance from the surfac
e. The rates are obtained from the experiments in a straightforward ma
nner and can be considered as a profound basis for the comparison with
theoretical calculations. (C) 1998 Elsevier Science B.V. All rights r
eserved.