Ea. Romanovsky et al., ON CARBON NITRIDE SYNTHESIS AT HIGH-DOSE ION-IMPLANTATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 139(1-4), 1998, pp. 355-358
Rutherford backscattering spectrometry was used for the study of high
dose 35 keV nitrogen ions implantation into graphites and glassy carbo
n. Quantitative data on depth profiles and its dependencies on irradia
tion fluence and ion beam density were obtained. The stationary dome-s
haped depth profile with maximum nitrogen concentration 22-27 at.% and
half-width more than twice exceeding projected range of ions is reach
ed at fluence Phi similar to 10(18) cm(-2). The dependence of the maxi
mum concentration in the profile on ion current density was studied. T
he largest concentration was obtained at reduced ion current density.
(C) 1998 Elsevier Science B.V.