The variation of the deep-level spectrum of stoichiometric ZnTe in the
various stages of its purification and annealing in saturated Zn vapo
r has been studied by low-temperature photoluminescence and IR Fourier
spectroscopy. The relation between the concentration of the main resi
dual impurities with complex formation probability is analyzed. We hav
e succeeded in observing for the first time Z center emission in ZnTe,
as previously in CdTe and ZnSe. This center is shown to be a multicha
rged impurity in ZnTe. The activation energies of these levels have be
en determined. A comparison of the data obtained by chemical analysis
with optical spectra has led to a conclusion that this center is assoc
iated with isolated oxygen present on the metalloid sublattice. While
this emission exhibits the same specific features in a number of II-VI
compounds (a high recombination rate, narrow emission lines, extremel
y weak electron-phonon coupling), the positions of the levels in the b
and gap and the characteristic charge state distinguish ZnTe from CdTe
and ZnSe. As a rule, the Z center forms in a material in decompositio
n of various complexes (for instance, of the complex responsible for t
he 1.65-eV emission in ZnTe) and disappears when the material is doped
leading to formation of the same complexes. An assumption is put forw
ard that this center creates the main compensating deep levels and is
an essential component of easily forming complexes with impurities. It
s position in the lower half of the ZnTe band gap (in contrast to ZnSe
and CdTe) makes preparation of the n material difficult. (C) 1988 Ame
rican Institute of Physics.