COMMENT TO - BARALDI,A. ET-AL., SURF. SCI. 367 (1997) L67 - TEMPERATURE-PROGRAMMED X-RAY PHOTOELECTRON-SPECTROSCOPY - A NEW TECHNIQUE FOR THE STUDY OF SURFACE KINETICS

Authors
NETTESHEIM S HANDSCHUH M ZENOBI R
Citation
S. Nettesheim et al., COMMENT TO - BARALDI,A. ET-AL., SURF. SCI. 367 (1997) L67 - TEMPERATURE-PROGRAMMED X-RAY PHOTOELECTRON-SPECTROSCOPY - A NEW TECHNIQUE FOR THE STUDY OF SURFACE KINETICS, Surface science, 401(3), 1998, pp. 452-454
Citations number
3
Categorie Soggetti
Chemistry Physical
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
401
Issue
3
Year of publication
1998
Pages
452 - 454
Database
ISI
SICI code
0039-6028(1998)401:3<452:CT-BES>2.0.ZU;2-8
Abstract
It is possible to record time-resolved XPS spectra with standard equip ment, provided a modern computer-interfaced energy analyzer is used. A high emissivity beamline, as stipulated by Baraldi et al. [Surf. Sci. 367 (1997) L67] is not always necessary. This is demonstrated by a st udy on thermal desorption of thin poly-(ethylene glycol) films on sili ca. (C) 1998 Elsevier Science B.V. All rights reserved.