SIMULATION OF THE SCANNING TUNNELING AND ATOMIC-FORCE MICROSCOPY IMAGES OF A XANTHINE MONOLAYER ON GRAPHITE

Citation
D. Jung et al., SIMULATION OF THE SCANNING TUNNELING AND ATOMIC-FORCE MICROSCOPY IMAGES OF A XANTHINE MONOLAYER ON GRAPHITE, Surface science, 401(3), 1998, pp. 476-481
Citations number
22
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
401
Issue
3
Year of publication
1998
Pages
476 - 481
Database
ISI
SICI code
0039-6028(1998)401:3<476:SOTSTA>2.0.ZU;2-T
Abstract
The atomic force microscopy (AFM) and scanning tunneling microscopy (S TM) images of a monolayer of xanthine molecules adsorbed on graphite w ere simulated by calculating total and partial electron density plots for a model bilayer of xanthine and graphite. Unlike the case of the t otal density plots, the partial electron density plots depend strongly on the registry of xanthine molecules on the graphite lattice. This r esult explains why the STM images show a superstructure modulation, wh ereas the AFM images do not. (C) 1998 Elsevier Science B.V. All rights reserved.