DYNAMIC DIELECTRIC RESPONSE OF SMC-ASTERISK THIN-LAYER IN PLANAR GEOMETRY-THICKNESS MODE RELAXATION

Authors
RYCHETSKY I GLOGAROVA M BUBNOV AM
Citation
I. Rychetsky et al., DYNAMIC DIELECTRIC RESPONSE OF SMC-ASTERISK THIN-LAYER IN PLANAR GEOMETRY-THICKNESS MODE RELAXATION, Ferroelectrics (Print), 212(1-4), 1998, pp. 21-28
Citations number
9
Categorie Soggetti
Physics, Condensed Matter","Material Science
Journal title
Ferroelectrics (Print) → ACNP
ISSN journal
00150193
Volume
212
Issue
1-4
Year of publication
1998
Pages
21 - 28
Database
ISI
SICI code
0015-0193(1998)212:1-4<21:DDROST>2.0.ZU;2-N
Abstract
In non-helical SmC samples the thickness mode is a main source of per mittivity. This mode originates in fluctuations of director twist-bend between the sample surfaces, existing due to the polar surface anchor ing. Thickness and temperature dependences of relaxation frequency and dielectric strength of this mode is found and discussed on the basis of free energy.