COMPARATIVE-STUDY OF HELICAL PITCH AND ELECTROOPTICAL BEHAVIORS OF HIGHLY TWISTED S-C-ASTERISK AND SC-ASTERISK-ALPHA PHASES

Citation
V. Laux et al., COMPARATIVE-STUDY OF HELICAL PITCH AND ELECTROOPTICAL BEHAVIORS OF HIGHLY TWISTED S-C-ASTERISK AND SC-ASTERISK-ALPHA PHASES, Ferroelectrics (Print), 212(1-4), 1998, pp. 325-332
Citations number
16
Categorie Soggetti
Physics, Condensed Matter","Material Science
Journal title
ISSN journal
00150193
Volume
212
Issue
1-4
Year of publication
1998
Pages
325 - 332
Database
ISI
SICI code
0015-0193(1998)212:1-4<325:COHPAE>2.0.ZU;2-#
Abstract
The helical pitch measurement of a new fluoro substituted tolan deriva tives series have revealed a strong torsion in all the phases (S-C, T GB(A), TGB(C)). The compound n=12 (FH/FH/HH-12BTMHC) exhibits an extre mely small pitch value of about 0.06 mu m in the SC phase. Such a sma ll pitch value has only been observed in the SCalpha phase of a thiob enzoate series. A comparative electro-optical and thermal pitch behavi our study of the SC and SC*alpha phases is performed in order to know if the switching current peaks in the SCalpha phase are directly lin ked up to its structure.