RESONANT INELASTIC SOFT-X-RAY SCATTERING AT THE SI L-3 EDGE - EXPERIMENT AND THEORY

Authors
EISEBITT S LUNING J RUBENSSON JE SETTELS A DEDERICHS PH EBERHARDT W PATITSAS SN TIEDJE T
Citation
S. Eisebitt et al., RESONANT INELASTIC SOFT-X-RAY SCATTERING AT THE SI L-3 EDGE - EXPERIMENT AND THEORY, Journal of electron spectroscopy and related phenomena, 93(1-3), 1998, pp. 245-250
Citations number
23
Categorie Soggetti
Spectroscopy
Journal title
Journal of electron spectroscopy and related phenomena → ACNP
ISSN journal
03682048
Volume
93
Issue
1-3
Year of publication
1998
Pages
245 - 250
Database
ISI
SICI code
0368-2048(1998)93:1-3<245:RISSAT>2.0.ZU;2-6
Abstract
We present experimental data on the resonant inelastic soft X-ray scat tering at the Si L-3 edge in crystalline silicon. The experimental res ults are compared with scattering calculations based on LCAO and KKR b and-structure calculations. We discuss the origin of the spectral feat ures including the role of Si d-states in the scattering. (C) 1998 Els evier Science B.V. All rights reserved.