Reflection Electron Energy Loss Spectroscopy (REELS) using a 1 keV ele
ctron beam has been used to obtain the reflectivity spectra and the co
mplex dielectric constant of 3C-silicon carbide in the energy loss ran
ge 0-100 eV. The experimental results have been compared with the theo
retical results obtained using the Linearized Muffin Tin Orbitals (LMT
O-ASA) method. A reasonable agreement has been obtained between theory
and experiment. (C) 1998 Elsevier Science B.V. All rights reserved