We measured the temperature dependent current-voltage (J-V) characteri
stics of p a-SiC:H/n c-Si heterojunction solar cells with different do
ping levels in the p a-SiC:H layer. For heterojunction solar cells wit
h an undoped a-SiC:H layer, S-shaped J-V characteristics are observed
at room temperature leading to poor factors. Below room temperature, s
uch S-shape also appears for the cells with a highly doped p a-SiC:H l
ayer. Detailed simulation studies showed that the origin of this S-sha
pe lies in a reduced electric field in the c-Si depletion region, whic
h, in combination with a hole accumulation at the interface, causes an
increase in recombination losses. As long as the p a-SiC:H layer in t
hese heterojunction cells is highly doped (greater than or equal to 10
(19) cm(-3)), these collection problems do not occur under standard op
erating conditions (i.e., room temperature and 100 mW/cm(2) illuminati
on). (C) 1998 Elsevier Science B.V. All rights reserved.