G. Decesare et al., AMORPHOUS-SILICON SENSORS FOR OXIDIZED POROUS SILICON OPTICAL WAVE-GUIDES BURIED IN SILICON-WAFERS, Journal of non-crystalline solids, 230, 1998, pp. 1354-1358
We have developed an original technology to fabricate channel waveguid
es on monocrystalline silicon wafers, consisting of selective anodizat
ion followed by thermal processing. The obtained oxidised porous silic
on waveguides show waveguiding properties, moreover, due to the fabric
ation process, the waveguides are placed just under the surface of the
silicon wafer. A hydrogenated amorphous silicon film has been grown o
n top of the waveguide by a low temperature process, then aluminum con
tacts have been formed by standard lithography. Different device struc
tures (photodiodes and photoresistors) are presented. Current/voltage
properties in the dark and under light excitation accompanied with cap
acitance/voltage measurements have been used to develop a band diagram
model. (C) 1998 Elsevier Science B.V. All rights reserved.