This paper presents the design and the implementation of an optimized
Canny-Deriche edge detector, After a brief reminder of the filter's eq
uations, we define different techniques to speed up the sampling rate
of the IIR filter. In particular, improving the throughput rate of the
IIR filter, we present a look-ahead with decomposition technique. Thi
s method leads us to design a first chip, which performs at a sampling
rate of over 20 MHz with a silicon area of 60 mm(2). Using a local re
gister retiming method, we have designed a second circuit, which is ab
le to process a pixel in 30 ns with a silicon area of 30 mm(2). These
two approaches are compared. This work leads us to an ASIC which was d
esigned in a CMOS 1 mu m technology and successfully tested. (C) 1998
Academic Press Limited.