Yf. Zheng et al., HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY ON THE SUBSTRUCTURE OF TI-NI-HF B19' MARTENSITE, Materials letters, 36(1-4), 1998, pp. 142-147
The substructure of martensite in the Ti,,Ni,,Hf,, alloy has been inve
stigated by high-resolution electron microscopy (HREM) and discussed w
ithin the framework of a phenomenological theoretical analysis. The (0
01) compound twins and (001) stacking faults were confirmed to be the
main substructure inside a martensite variant with some (011) stacking
faults infrequently observed. The (001) twinning boundary was straigh
t with some blurred regions and (001) faults existing near the interfa
ce. The (001) compound twin alone is shown to be unable to produce the
lattice invariant shear necessary for the martensitic transformation.
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