HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY ON THE SUBSTRUCTURE OF TI-NI-HF B19' MARTENSITE

Citation
Yf. Zheng et al., HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY ON THE SUBSTRUCTURE OF TI-NI-HF B19' MARTENSITE, Materials letters, 36(1-4), 1998, pp. 142-147
Citations number
14
Categorie Soggetti
Material Science","Physics, Applied
Journal title
ISSN journal
0167577X
Volume
36
Issue
1-4
Year of publication
1998
Pages
142 - 147
Database
ISI
SICI code
0167-577X(1998)36:1-4<142:HESOTS>2.0.ZU;2-1
Abstract
The substructure of martensite in the Ti,,Ni,,Hf,, alloy has been inve stigated by high-resolution electron microscopy (HREM) and discussed w ithin the framework of a phenomenological theoretical analysis. The (0 01) compound twins and (001) stacking faults were confirmed to be the main substructure inside a martensite variant with some (011) stacking faults infrequently observed. The (001) twinning boundary was straigh t with some blurred regions and (001) faults existing near the interfa ce. The (001) compound twin alone is shown to be unable to produce the lattice invariant shear necessary for the martensitic transformation. (C) 1998 Elsevier Science B.V. All rights reserved.